Wafer breakage is the most serious impact of killer crystalline defects. About 0.1 to 0.2% of silicon wafers break. The ...

Concrete structures like roads and bridges require nondestructive testing methods to identify interior defects without destroying their structure. Most methods send sound waves into the material and ...

Scientists used Lorentz transmission electron microscopy (LTEM) to visualize topological defects. They were able to do so by passing electrons and observing their deflections through a thin magnetic ...

Scientists have identified a new type of defect as the most common source of disorder in on-surface synthesized graphene nanoribbons, a novel class of carbon-based materials that may prove extremely ...

This paper reviews the research progress of layered double hydroxide (LDH) with various types of defects and its regulation strategies in recent years. Furthermore, the relationship between the ...

It may contain inaccuracies due to the limitations of machine translation. Researchers inspect the quality of a fabricated silicon heterojunction solar cell. Provided by KIER A Korean research team ...